发明名称 ELLIPTIC POLARIZATION MEASURING METHOD, ELLIPTIC POLARIMETERAND DEVICE FOR CONTROLLING FORMATION OF LAYER USING METHOD AND DEVICE THEREOF
摘要 PROBLEM TO BE SOLVED: To realize a phase modulated elliptical polarization method in which the accuracy is enhanced in measurement by solving the problem of periodic oscillation. SOLUTION: Measurements Iom , Ism and Icm are derived from a signal 50 indicative of measured intensity I(t) . At the first step 51, Fourier components S0 , S1 , S2 are calculated for a continuous and modulated pulsesω, 2ωand at the second step 52, measurements Iom , Ism and Icm are determined from the components S0 , S1 , S2 . Method of iteration 53 is applied to the measurements and initial theoretical values Is1 /Io1 and Ie1 /Io1 are derived from an input variable 55. The theoretical values obtained at Step 57 are compared with the Ism /Iom and Icm /Iom determined at Step 52. The comparison 58 requires quantization of the difference between theoretical value and measured value. When the difference is smaller than a limit value, the measurements are approximated sufficiently and a numeral 54 is provided as a physical variable for calculating the measurement. After ending the comparison 58, an estimated value 59 following to the physical variable is specified.
申请公布号 JPH0915140(A) 申请公布日期 1997.01.17
申请号 JP19960080417 申请日期 1996.02.27
申请人 INSTRUMENTS SA 发明人 BERUNAARU DOREBUIRON;MORUTAN KIRUDEEMO;RANDAANU BANFUERAATO
分类号 G01J4/00;G01J4/04;G01N21/21;H01L21/66;(IPC1-7):G01N21/21 主分类号 G01J4/00
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