发明名称 |
SEMICONDUCTOR DEVICE SEPARATING FILM MANUFACTURING METHOD USING TRENCH |
摘要 |
PURPOSE: A semiconductor device separating film manufacturing method is provided to repress the leakage current caused by the concentration of an electric field by making round the corner of a trench. CONSTITUTION: The semiconductor device separating film manufacturing method comprises the steps of: forming an oxidizing film(24) and a nitride film(23) in order on a semiconductor substrate; forming a nitride film(23) and an oxidizing film(24) patterns through a mask defining the field and eliminating a side of the oxidizing film(24); and decreasing the grade of the etching corner of the semiconductor substrate by etching a certain depth of the exposed semiconductor substrate with the aromatic etching solution.
|
申请公布号 |
KR20000003439(A) |
申请公布日期 |
2000.01.15 |
申请号 |
KR19980024681 |
申请日期 |
1998.06.29 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD |
发明人 |
WON, DAE HEE;KIM, YUNG BOK;GO, JUNG GEUN |
分类号 |
H01L21/76;(IPC1-7):H01L21/76 |
主分类号 |
H01L21/76 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|