METHOD OF DETECTING FAILURE OF SEMICONDUCTOR INTEGRATED CIRCUIT AND METHOD OF GENERATING DC TEST PATTERN

摘要

PROBLEM TO BE SOLVED: To solve a problem that a long time is required for test because a conventional test pattern is elongated in order to detect failure of the entire logic circuit, and a problem that a case where the testability does not become 100%, occurs in DC parameter test because an output mode may not be set for a bi-directional pin, and to provide a method of detecting a failure of a semiconductor integrated circuit in which DC parameter test can be carried out efficiently. SOLUTION: The method of detecting failure of a semiconductor integrated circuit is arranged such that a failure is set only for the output pin and the bi-directional pin of the semiconductor integrated circuit and a DC test pattern for detecting that failure is generated. COPYRIGHT: (C)2004,JPO