发明名称 |
Test platform, test apparatus and control method thereof |
摘要 |
A test platform is provided for testing a detection module of a test apparatus to determine whether correction is needed or for quality control of the test apparatus. The test platform includes a body, and at least one reference material which is formed on the body and on which at least one color is printed. |
申请公布号 |
US9482680(B2) |
申请公布日期 |
2016.11.01 |
申请号 |
US201313949674 |
申请日期 |
2013.07.24 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
Lee Ki Ju;Lee Suk Yong;Lee Young Goun |
分类号 |
G01N35/00 |
主分类号 |
G01N35/00 |
代理机构 |
Sughrue Mion, PLLC |
代理人 |
Sughrue Mion, PLLC |
主权项 |
1. A test platform comprising:
a body; at least one reference material which is formed on the body and on which at least one color is printed; and a tag that stores information related to the test platform determining whether a detection module of a test apparatus comprising at least one hardware processor needs to be corrected, wherein the tag includes a reference value with respect to a result of detection regarding the reference material by the detection module, and identification information identifying whether the test platform is a microfluidic device or a test platform testing the detection module of a test apparatus. |
地址 |
Suwon-si KR |