发明名称 Test platform, test apparatus and control method thereof
摘要 A test platform is provided for testing a detection module of a test apparatus to determine whether correction is needed or for quality control of the test apparatus. The test platform includes a body, and at least one reference material which is formed on the body and on which at least one color is printed.
申请公布号 US9482680(B2) 申请公布日期 2016.11.01
申请号 US201313949674 申请日期 2013.07.24
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 Lee Ki Ju;Lee Suk Yong;Lee Young Goun
分类号 G01N35/00 主分类号 G01N35/00
代理机构 Sughrue Mion, PLLC 代理人 Sughrue Mion, PLLC
主权项 1. A test platform comprising: a body; at least one reference material which is formed on the body and on which at least one color is printed; and a tag that stores information related to the test platform determining whether a detection module of a test apparatus comprising at least one hardware processor needs to be corrected, wherein the tag includes a reference value with respect to a result of detection regarding the reference material by the detection module, and identification information identifying whether the test platform is a microfluidic device or a test platform testing the detection module of a test apparatus.
地址 Suwon-si KR