发明名称 INSPECTING INSTRUMENT FOR THROUGH-HOLE DEFECT
摘要 PURPOSE:To detect the defect of a through-hole in a printed board by one photodetecting means by providing a photomask, etc., in front of one sensor element assembly. CONSTITUTION:When the printed board 3 is at a position 3, light 5 projected from the lower part of the through-hole 6 passes the center hole of the hole 6 and is incident on through-hole arrays 13a-13d bored in the mask 12 of the photodetecting means 15. Then, the output of the sensor element assembly is supplied to a demarcation circuit 15 to detect the position of the hole 6. When the printed board moves to a position 3a, a light shield mask 4 is provided on the reverse surface of the position-detected hole 6 and light 5 is projected. If there is a defect, leaking light is emitted from the center hole of the hole 6 through a lens 18 and incident on the through-hole arrays 14a-14e bored in the mask 12 of the means 15; and the output of the assembly 10 is supplied to the circuit 16 to detect the pinhole defect while no leaking light is obtained when the printed board is normal.
申请公布号 JPS62299746(A) 申请公布日期 1987.12.26
申请号 JP19860142934 申请日期 1986.06.20
申请人 FUJITSU LTD 发明人 ANDO MORITOSHI;MITA KIKUO
分类号 G01N21/88;G01N21/956;H05K3/00 主分类号 G01N21/88
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