发明名称 Liquid crystal panel inspection method
摘要 A method of inspecting a liquid crystal panel and determining the type of defect. Each part of the liquid crystal panel is extracted and inspected by comparison with an extracted reference part. The parts to be inspected may be found based on the location of previously found parts or by examining a plot of the density in the image. Vector data from a part that is known to be defectless is used to extract the reference part. Alternatively, the contour of a reference part may be determined by analyzing the vector data which was obtained for the parts to be inspected. The type of defect is determined by classifying the defective part according to characteristics of the part's image (e.g., brightness of the pixels) as compared with parts having known defects.
申请公布号 US5394481(A) 申请公布日期 1995.02.28
申请号 US19920820925 申请日期 1992.01.15
申请人 EZEL INC 发明人 KUMAGAI, RYOHEI;HIIRO, KAORU;SHIMIZU, HARUMI;OOSAKA, MANABU;TAKAHASHI, TOORU
分类号 G01N21/88;G01N21/95;(IPC1-7):G06K9/00;G06K9/20;G06K9/48 主分类号 G01N21/88
代理机构 代理人
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