发明名称 RETAINING RING FOR LOWER WAFER DEFECTS
摘要 PROBLEM TO BE SOLVED: To provide a retaining ring and a chemical mechanical planarization system (CMP).SOLUTION: In one embodiment, a retaining ring for a polishing system includes a ring-shaped body having a polished inner diameter. The body has a bottom surface having grooves formed therein, an outer diameter wall, and an inner diameter wall, where the inner diameter wall is polished to a roughness average (R) less than about 30 microinches (μin).SELECTED DRAWING: Figure 3
申请公布号 JP2016178304(A) 申请公布日期 2016.10.06
申请号 JP20160056050 申请日期 2016.03.18
申请人 APPLIED MATERIALS INC 发明人 HU YONGQI;YAVELBERG SIMON;GANGADHAR SHEELAVANT;KADTHALA R NARENDRNATH
分类号 H01L21/304;B24B37/10;B24B37/32 主分类号 H01L21/304
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