发明名称 Method for forming pattern by using langmuir-blodgett film.
摘要 <p>A method of forming a pattern is disclosed which comprises the steps of: forming a metal-containing Langmuir-Blodgett film (4, 4 min ) on a substrate (1) through a thin film (3, 2 min ) to be subjected to patterning; exposing the Langmuir-Blodgett film to an energy beam (6, 6 min ) so that the Langmuir-Blodgett film is selectively irradiated with the energy beam; dissolving the unirradiated part of the Langmuir-Blodgett film to form a pattern of the Langmuir-Blodgett film; and selectively etching the thin film (3, 2 min ) with reactive ions (7, 7 min ) by using the pattern of the Langmuir-Blodgett film as a mask.</p>
申请公布号 EP0308902(A2) 申请公布日期 1989.03.29
申请号 EP19880115501 申请日期 1988.09.21
申请人 HITACHI, LTD. 发明人 MOCHIJI, KOZO;TOMIOKA, YASUSHI HITACHI DAIYON KYOSHIN RYO;KIMURA, TAKESHI
分类号 H01L21/302;G03F7/16;H01L21/033;H01L21/3065;H01L21/311;H01L21/3213 主分类号 H01L21/302
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