发明名称 |
Method for forming pattern by using langmuir-blodgett film. |
摘要 |
<p>A method of forming a pattern is disclosed which comprises the steps of: forming a metal-containing Langmuir-Blodgett film (4, 4 min ) on a substrate (1) through a thin film (3, 2 min ) to be subjected to patterning; exposing the Langmuir-Blodgett film to an energy beam (6, 6 min ) so that the Langmuir-Blodgett film is selectively irradiated with the energy beam; dissolving the unirradiated part of the Langmuir-Blodgett film to form a pattern of the Langmuir-Blodgett film; and selectively etching the thin film (3, 2 min ) with reactive ions (7, 7 min ) by using the pattern of the Langmuir-Blodgett film as a mask.</p> |
申请公布号 |
EP0308902(A2) |
申请公布日期 |
1989.03.29 |
申请号 |
EP19880115501 |
申请日期 |
1988.09.21 |
申请人 |
HITACHI, LTD. |
发明人 |
MOCHIJI, KOZO;TOMIOKA, YASUSHI HITACHI DAIYON KYOSHIN RYO;KIMURA, TAKESHI |
分类号 |
H01L21/302;G03F7/16;H01L21/033;H01L21/3065;H01L21/311;H01L21/3213 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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