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发明名称
Conductive pattern for electric test of semiconductor chips.
摘要
申请公布号
EP0325269(B1)
申请公布日期
1994.03.23
申请号
EP19890100956
申请日期
1989.01.20
申请人
KABUSHIKI KAISHA TOSHIBA
发明人
ISHIKAWA, MICHIHIRO
分类号
H01L23/544;G01R1/067;G01R31/28;H01L21/66;(IPC1-7):G01R31/28
主分类号
H01L23/544
代理机构
代理人
主权项
地址
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