发明名称 PROBE FOR SHAPE MEASUREMENT
摘要 PROBLEM TO BE SOLVED: To permit highly accurate measurement without damaging the surface of an object to be measured. SOLUTION: A stylus 10 is contactlessly supported to a probe body 1 through a first noncontact support means 30, and a contact ball 20 is contactlessly supported to the tip end of the stylus 10 through a second noncontact support means 40. The first noncontact support means 30 is composed of a movable magnetic pole 31 disposed along the outer circumference of the base end side of the stylus 10, and a fixed magnetic pole 33 disposed in the probe body 1 so as to surround the movable magnetic pole 31. A first displacement detection means 50 to detect the axial displacement and radial displacement of the stylus 10, and a second displacement detection means 60 to detect the displacement of the center position of the contact ball 20 with respect to the stylus 10 are added.
申请公布号 JP2000155002(A) 申请公布日期 2000.06.06
申请号 JP19980329326 申请日期 1998.11.19
申请人 MITSUTOYO CORP 发明人 NISHIOKI NOBUHISA;OKAMOTO KIYOKAZU;HARA SOTOMITSU;SAKAI HISAYOSHI
分类号 G01B5/00;G01B5/012;G01B5/016;G01B5/20;G01B21/00;G01B21/20;(IPC1-7):G01B5/20 主分类号 G01B5/00
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