发明名称 |
Sensing circuit for resistive memory cells |
摘要 |
A sensing system may include a sense amplifier, a sensing circuit configured to sense a current difference, a data cell selectively coupled to the sensing circuit, a first reference cell selectively coupled to the sensing circuit, and a second reference cell selectively coupled to the sensing circuit. The resistance of the first reference cell and the second reference cell are different. |
申请公布号 |
US9502091(B1) |
申请公布日期 |
2016.11.22 |
申请号 |
US201514843546 |
申请日期 |
2015.09.02 |
申请人 |
QUALCOMM Incorporated;Industry-Academic Cooperation Foundation, Yonsei University |
发明人 |
Jung Seong-Ook;Na Taehui;Song Byung Kyu;Kim Jung Pill;Kang Seung Hyuk |
分类号 |
G11C11/00;G11C11/16;G11C7/12;G11C7/06;G11C11/4091;G11C11/4097 |
主分类号 |
G11C11/00 |
代理机构 |
Muncy, Geissler, Olds & Lowe, P.C. |
代理人 |
Muncy, Geissler, Olds & Lowe, P.C. |
主权项 |
1. An apparatus comprising:
a sense amplifier configured to input a first voltage output and a second voltage output; a sensing circuit configured to sense a voltage difference between the first voltage output and the second voltage output and input a third voltage output and a fourth voltage output, the sensing circuit coupled to the first voltage output and the second voltage output and configured to cancel an offset voltage in a dual stage sensing operation; a data cell coupled to the third voltage output and the fourth voltage output; a first reference cell selectively coupled to the fourth voltage output; and a second reference cell selectively coupled to the third voltage output, wherein the data cell is configured the same as the first reference cell and the second reference cell to form a regular array structure. |
地址 |
San Diego CA US |