发明名称 INTERLOCKING CIRCUIT TEST EQUIPMENT AND TEST METHOD
摘要 An interlocking circuit test equipment and test method belong to the technical field of semiconductor interlocking circuit detection. The test method comprises: a signal to be detected is configured; the corresponding state is written into the corresponding port of a tested PCB according to the configured signal; the PCB changes according to a state of an input terminal, a workable circuit would work and the corresponding output terminal state changes; changed output terminal output values are collected and compared to configured information in the preceding step; and a value which cannot match is explained and stored. Problems that test time is long, reliability is low, and the tested PCB or a device is easily damaged are solved. The test equipment can carry out batch test, not only increasing test efficiency and reducing test time, but also being able to guarantee integral quality of the test, so as to protect the product and the component from being damaged.
申请公布号 WO2017035927(A1) 申请公布日期 2017.03.09
申请号 WO2015CN92173 申请日期 2015.10.19
申请人 SHENYANG PIOTECH CO., LTD. 发明人 LV, Xin;ZHOU, Ren;LIU, Zhongwu
分类号 G01R31/28 主分类号 G01R31/28
代理机构 代理人
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