发明名称 MEASURING DEVICE, MEASURING METHOD, AND PROGRAMS THEREFOR
摘要 A technique for identifying a measurement planned position for electromagnetic waves in a three-dimensional space in a simple and easy manner is provided. A position of a measuring unit 200 that is carried by an operator 100 is measured by a position measuring device that is configured to measure a position by laser light. A positional relationship between the measured position and the position of a measurement planned position 601 is displayed on a terminal 300 that is carried by the operator 100. This display guides the operator 100, and the operator 100 identifies the measurement planned position 601 and measure illuminance thereat.
申请公布号 US2017097260(A1) 申请公布日期 2017.04.06
申请号 US201615283804 申请日期 2016.10.03
申请人 TOPCON CORPORATION 发明人 NAGASHIMA Hiroki;SHOJI Atsushi;OIDE Akira
分类号 G01J1/42;G01J1/44 主分类号 G01J1/42
代理机构 代理人
主权项 1. A measuring device comprising: a controlling unit configured to control displaying of a relationship between a three-dimensional position of a measurement planned position and a three-dimensional position of an electromagnetic wave measuring device, on a display, the measurement planned position being set as a candidate at which electromagnetic waves are measured by the electromagnetic wave measuring device, and the three-dimensional position of the electromagnetic wave measuring device being measured by a position measuring device.
地址 Itabashi-ku JP
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