发明名称 |
MEASURING DEVICE, MEASURING METHOD, AND PROGRAMS THEREFOR |
摘要 |
A technique for identifying a measurement planned position for electromagnetic waves in a three-dimensional space in a simple and easy manner is provided. A position of a measuring unit 200 that is carried by an operator 100 is measured by a position measuring device that is configured to measure a position by laser light. A positional relationship between the measured position and the position of a measurement planned position 601 is displayed on a terminal 300 that is carried by the operator 100. This display guides the operator 100, and the operator 100 identifies the measurement planned position 601 and measure illuminance thereat. |
申请公布号 |
US2017097260(A1) |
申请公布日期 |
2017.04.06 |
申请号 |
US201615283804 |
申请日期 |
2016.10.03 |
申请人 |
TOPCON CORPORATION |
发明人 |
NAGASHIMA Hiroki;SHOJI Atsushi;OIDE Akira |
分类号 |
G01J1/42;G01J1/44 |
主分类号 |
G01J1/42 |
代理机构 |
|
代理人 |
|
主权项 |
1. A measuring device comprising:
a controlling unit configured to control displaying of a relationship between a three-dimensional position of a measurement planned position and a three-dimensional position of an electromagnetic wave measuring device, on a display, the measurement planned position being set as a candidate at which electromagnetic waves are measured by the electromagnetic wave measuring device, and the three-dimensional position of the electromagnetic wave measuring device being measured by a position measuring device. |
地址 |
Itabashi-ku JP |