发明名称 ANTIFUSE ELEMENT USING SPACER BREAKDOWN
摘要 Techniques and circuitry are disclosed for efficiently implementing programmable memory array circuit architectures, including both non-volatile and volatile memories. The memory circuitry employs an antifuse scheme that includes an array of 1 T bitcells, wherein each bitcell effectively contains one gate or transistor-like device that provides both an antifuse element and a selector device for that bitcell. In particular, the bitcell device has asymmetric trench-based source/drain contacts such that one contact forms a capacitor in conjunction with the spacer and gate metal, and the other contact forms a diode in conjunction with a doped diffusion area and the gate metal. The capacitor serves as the antifuse element of the bitcell, and can be programmed by breaking down the spacer. The diode effectively provides a Schottky junction that serves as a selector device which can eliminate program and read disturbs from bitcells sharing the same bitline/wordline.
申请公布号 EP3123509(A1) 申请公布日期 2017.02.01
申请号 EP20140887643 申请日期 2014.03.24
申请人 Intel Corporation 发明人 CHANG, Ting;JAN, Chia-Hong;HAFEZ, Walid, M.
分类号 H01L23/62;G11C29/04 主分类号 H01L23/62
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