发明名称 REUSABLE SEMICONDUCTOR SUBSTRATES
摘要 In example implementations, a plurality of material layers and a plurality of etch stop layers are grown on a first substrate. Ions are implanted through at least one material layer of the plurality of material layers into an etch stop layer of the plurality of etch stop layers to create defects in the etch stop layer. A first material layer of the substrate is bonded to a second substrate. The etch stop layer is split to remove the first substrate from the second substrate. The first substrate is reused to bond another material layer of the plurality of material layers to a third substrate.
申请公布号 US2017011964(A1) 申请公布日期 2017.01.12
申请号 US201514795684 申请日期 2015.07.09
申请人 Hewlett-Packard Development Company, L.P. 发明人 Liang Di
分类号 H01L21/78;H01L21/3105;H01L21/02 主分类号 H01L21/78
代理机构 代理人
主权项
地址 Houston TX US