发明名称 Method for Integrated Circuit Manufacturing
摘要 A method of manufacturing an integrated circuit (IC) includes: receiving a target layout of the IC, decomposing the target layout into a plurality of sub-layouts for a multiple patterning process, identifying re-locatable pattern edges in the sub-layouts, and relocating the edges to improve manufacturability of the IC. In an embodiment, relocating the edges includes: choosing an evaluation index based on a target manufacturing process, moving one or more of the edges, calculating a score of manufacturability based on the evaluation index, and repeating the moving and the calculating until the score meets a threshold.
申请公布号 US2017004242(A1) 申请公布日期 2017.01.05
申请号 US201514754769 申请日期 2015.06.30
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Chang Shih-Ming;Lee Chien-Fu;Tseng Chin-Yuan
分类号 G06F17/50 主分类号 G06F17/50
代理机构 代理人
主权项 1. A method comprising: receiving a target layout of an integrated circuit (IC); decomposing the target layout into a plurality of sub-layouts for a multiple patterning process, wherein the sub-layouts include a plurality of pattern edges, each of which is re-locatable within a respective region of freedom; relocating the pattern edges to improve manufacturability of the IC, resulting in modified sub-layouts; and storing the modified sub-layouts in a tangible computer-readable medium for use by a further IC process stage.
地址 Hsin-Chu TW
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