发明名称 Resistive memory device and operating method
摘要 Provided are a resistive memory device including a plurality of memory cells, and a method of operating the resistive memory device. The resistive memory device includes a sensing circuit connected to a first signal line, to which a memory cell is connected, the sensing circuit sensing data stored in the memory cell based on a first reference current; and a reference time generator for generating a reference time signal that determines a time point when a result of the sensing is to be output, based on the first reference current.
申请公布号 US9536605(B2) 申请公布日期 2017.01.03
申请号 US201514806780 申请日期 2015.07.23
申请人 Samsung Electronics Co., Ltd. 发明人 Park Hyun-Kook;Lee Yeong-Taek;Byeon Dae-Seok;Kim Bo-Geun
分类号 G11C11/00;G11C13/00;G11C11/56;G11C11/16 主分类号 G11C11/00
代理机构 Volentine & Whitt, PLLC 代理人 Volentine & Whitt, PLLC
主权项 1. A resistive memory device comprising: a memory cell array including a memory cell connected to a first signal line and a second signal line; a sensing circuit connected to the first signal line, wherein the sensing circuit is configured to sense data stored in the memory cell based on a first reference current flowing through the first signal line; and a reference time generator is configured to generate a reference time signal that determines a time at which the sensing of the stored data by the sensing circuit occurs based on the first reference current, wherein the sensing circuit comprises a first current source configured to provide the first reference current to the first signal line,a first capacitor connected to the first signal line, anda sense amplifier configured to compare a first reference voltage with a voltage apparent on the first signal line in response to the reference time signal, wherein the reference time generator comprises a second current source configured to generate a second reference current based on the first reference current,a second capacitor charged by the second reference current, anda comparator configured to compare a second reference voltage with a voltage of the second capacitor and provide a corresponding comparison result as the reference time signal, and wherein a time required for the first capacitor to be charged to a level of the first reference voltage in response to the first reference current is less than a time required for the second capacitor to be charged to a level of the second reference voltage in response to the second reference current.
地址 Suwon-si, Gyeonggi-do KR