发明名称 |
TEMPERATURE CORRECTION SYSTEM AND METHOD FOR X-RAY DETECTOR |
摘要 |
The present invention provides temperature correction system and method for X-ray detector. The method comprises: obtaining offset data of pixel units of the X-ray detector at a current temperature; subtracting calibration offset data of each pixel unit at a preset temperature from the offset data of the pixel unit at the current temperature to obtain a current offset data increment of each pixel unit; obtaining X-ray response data of each pixel unit with a preset scanning parameter at the current temperature; obtaining a current X-ray response data increment of each pixel unit based on a pre-stored transform function, wherein the transform function uses the current offset data increment of each pixel unit and the X-ray response data of each pixel unit at the current temperature as independent variables, and uses the current X-ray response data increment of each pixel unit as a dependent variable; and obtaining corrected X-ray response data of each pixel unit by subtracting the current X-ray response data increment of each pixel unit from the X-ray response data of each pixel unit at the current temperature. |
申请公布号 |
US2016306056(A1) |
申请公布日期 |
2016.10.20 |
申请号 |
US201615099805 |
申请日期 |
2016.04.15 |
申请人 |
General Electric Company |
发明人 |
Sun Yunfeng;Nie Guanying;Sun Ke |
分类号 |
G01T7/00 |
主分类号 |
G01T7/00 |
代理机构 |
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代理人 |
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主权项 |
1. A temperature correction system for an X-ray detector, the system comprising:
an offset data obtaining module for obtaining offset data of pixel units of the X-ray detector at a current temperature; an offset data increment obtaining module for subtracting calibration offset data of each of the pixel units at a preset temperature from the offset data of the pixel unit at the current temperature to obtain a current offset data increment of the each pixel unit; an X-ray response data obtaining module for obtaining X-ray response data of the each pixel unit with a preset scanning parameter at the current temperature; a transforming module for obtaining a current X-ray response data increment of the each pixel unit based on a pre-stored transform function, wherein the transform function uses the current offset data increment of the each pixel unit and the X-ray response data of the each pixel unit at the current temperature as independent variables, and uses the current X-ray response data increment of the each pixel unit as a dependent variable; and a correcting module for obtaining corrected X-ray response data of the each pixel unit by subtracting the current X-ray response data increment of the each pixel unit from the X-ray response data of the each pixel unit at the current temperature. |
地址 |
Schenectady NY US |