发明名称 Self-retaining via probe
摘要 A planar body is configured such that its edges engage the sidewall of a via of a device under test to create point electrical contacts and the planar body resists removal of the planar body from the via after insertion. The edges of the planar body may include barbs that create point electrical contacts and resist removal of the planar body from the via after insertion. The end of the body that is inserted into the via may form a tapered tip to facilitate insertion. The end of the planar body that is inserted into the via may include barbs that resist removal of the planar body from the via after insertion. The edges of the planar body may include stops that prevent further insertion of the planar body into the via beyond the stops.
申请公布号 EP2555002(B1) 申请公布日期 2016.09.14
申请号 EP20120176965 申请日期 2012.07.18
申请人 TEKTRONIX, INC. 发明人 ENGQUIST, DAVID T;MANTEL, BRIAN S
分类号 G01R1/067 主分类号 G01R1/067
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