| 摘要 |
A method includes the steps of: (a) measuring a height of a pillar spacer after the pillar spacer is formed on a main surface of a CF substrate; (b) measuring a gap between a TFT substrate and the CF substrate after the TFT substrate and the CF substrate are bonded to each other; and (c) determining a quality of a liquid crystal panel based on the difference between the measured height of the pillar spacer and the measured gap. |
