| 摘要 |
PROBLEM TO BE SOLVED: To provide a column ADC (analog/digital conversion circuit) having configuration capable of inspecting existence of a short circuit fault in column memories, and solving the problem that when inspecting a plurality of column memories included in the analog/digital conversion circuit, a common inspection signal is written in the plurality of column memories, thereby even if there is the short circuit fault in the plurality of column memories, the short circuit fault cannot be discovered by inspection.SOLUTION: An analog/digital conversion circuit that has a plurality of circuit sections comprising a plurality of memories and a plurality of comparators and converts analog signals to digital signals includes a test signal supply section for supplying test signals to hold different digital signals in the memories included in a part of the plurality of circuit sections and the memories included in another part of the plurality of circuit sections. |
