发明名称 Method of detecting an arc occurring during the power supply of a plasma process, control unit for a plasma power supply, and plasma power supply
摘要 A plasma power supply (10) for supplying a plasma process in a plasma chamber(30) with a power comprises: a. a DC-Source (15); b. an output signal generator (16) connected to the DC source (15); c. a first signal sequence measurement device (20) for measuring a signal sequence present between the DC source (15) and the output signal generator (16); d. a second signal sequence measurement device (18, 19) for measuring a signal sequence present at the output of the output signal generator (16); f. a control unit (14), which is connected to the first and second signal sequence measurement devices (18, 19, 20).
申请公布号 EP3035365(A1) 申请公布日期 2016.06.22
申请号 EP20140461600 申请日期 2014.12.19
申请人 TRUMPF HUETTINGER SP. Z O. O. 发明人 ZELECHOWSKI, DR. MARCIN;LACH, PIOTR;GIERALTOWSKI, ANDRZEJ;GRABOWSKI, ADAM;GAPINSKI, CEZARY
分类号 H01J37/32 主分类号 H01J37/32
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