发明名称 |
Method of detecting an arc occurring during the power supply of a plasma process, control unit for a plasma power supply, and plasma power supply |
摘要 |
A plasma power supply (10) for supplying a plasma process in a plasma chamber(30) with a power comprises:
a. a DC-Source (15);
b. an output signal generator (16) connected to the DC source (15);
c. a first signal sequence measurement device (20) for measuring a signal sequence present between the DC source (15) and the output signal generator (16);
d. a second signal sequence measurement device (18, 19) for measuring a signal sequence present at the output of the output signal generator (16);
f. a control unit (14), which is connected to the first and second signal sequence measurement devices (18, 19, 20). |
申请公布号 |
EP3035365(A1) |
申请公布日期 |
2016.06.22 |
申请号 |
EP20140461600 |
申请日期 |
2014.12.19 |
申请人 |
TRUMPF HUETTINGER SP. Z O. O. |
发明人 |
ZELECHOWSKI, DR. MARCIN;LACH, PIOTR;GIERALTOWSKI, ANDRZEJ;GRABOWSKI, ADAM;GAPINSKI, CEZARY |
分类号 |
H01J37/32 |
主分类号 |
H01J37/32 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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