发明名称 BLANKING SYSTEM FOR MULTI CHARGED PARTICLE BEAMS, AND MULTI CHARGED PARTICLE BEAM WRITING APPARATUS
摘要 A blanking system for multi charged particle beams includes a blanking aperture array device to include a first substrate where a plurality of openings corresponding to passage positions of multi-beams are formed in a penetrating manner from the upper surface, and a plurality of electrode groups each having a pair of electrodes which are close to a corresponding one of the plurality of openings and are at opposite sides, on a same surface, of the corresponding one of the plurality of openings are arranged on the first substrate, a second substrate whose lower surface is electrically connected through a bump to the upper surface of the first substrate, and a mounting substrate whose upper surface is electrically connected through a bump to the lower surface of the second substrate.
申请公布号 US2016141142(A1) 申请公布日期 2016.05.19
申请号 US201514879447 申请日期 2015.10.09
申请人 NuFlare Technology, Inc. 发明人 MATSUMOTO Hiroshi
分类号 H01J37/04;H01J37/20;H01J37/317 主分类号 H01J37/04
代理机构 代理人
主权项 1. A blanking system for multi charged particle beams comprising: a blanking aperture array device configured to include a first substrate where a plurality of openings corresponding to passage positions of multi-beams are formed in a penetrating manner from an upper surface, and a plurality of electrode groups each having a pair of electrodes which are close to a corresponding one of the plurality of openings and are at opposite sides, on a same surface, of the corresponding one of the plurality of openings are arranged on the first substrate; a second substrate whose lower surface is electrically connected through a bump to an upper surface of the first substrate; and a mounting substrate whose upper surface is electrically connected through a bump to a lower surface of the second substrate.
地址 Yokohama JP