| 摘要 |
A semiconductor device includes a fuse control part which enters a test mode, generates an internal address according to the combination of repair data, and generates a first and a second voltage control signal in response to a rupture control signal enable to rupture a fuse set for selecting a redundancy word line having a defect; and a fuse array which includes fuse sets selected according to the combination of the internal address, and outputs fuse data by rupturing the fuse set for selecting the redundancy word line having a defect in response to the first and the second voltage control signal. So, the fuse set can be automatically cut. |
