LOW-COST TEST/CALIBRATION SYSTEM AND CALIBRATED DEVICE FOR LOW-COST TEST/CALIBRATION SYSTEM

摘要

A test/calibration system includes a device under test (DUT) and a calibrated device. The calibrated device is coupled to the DUT, transmits or receives a test signal to or from the DUT in response to a control signal for a test item to test, measure or calibrate functioning or performance of an internal component of the DUT.

主权项

1. A calibrated device, transmitting or receiving a test signal to or from a device under test (DUT) in response to a test item to test, measure or calibrate functioning or performance of an internal component of the DUT, comprising:
a chip, comprising:
at least one of an analog signal processing circuit and a baseband signal processing circuit; anda memory device, coupled to at least one of the analog signal processing circuit and the baseband signal processing circuit; and at least one external component, outside of the chip, processing the received test signal and transmit the processed signal to the chip for test result generation purpose, or receiving a signal from the chip and processing the signal to generate the test signal to be transmitted to the DUT; wherein the external component and/or the chip have been calibrated.