发明名称 Writing and verifying circuit for a resistive memory and method for writing and verifying a resistive memory
摘要 A writing and verifying circuit and a method for writing and verifying a resistive memory thereof are provided. The steps of the method includes: enabling at least one word line signal corresponding to at least one selected resistive memory cell of the resistive memory during a writing and verifying timing period; providing a bit line voltage to the selected resistive memory cells, wherein the bit line voltage continuously increases or decreases from a first voltage level to a second voltage level during the writing and verifying timing period; and, measuring a detected current through the bit line and determining a finish time point of the writing and verifying timing period according to the detected current and a reference current.
申请公布号 US9312001(B1) 申请公布日期 2016.04.12
申请号 US201514623507 申请日期 2015.02.17
申请人 Winbond Electronics Corp. 发明人 Huang Koying
分类号 G11C11/00;G11C13/00 主分类号 G11C11/00
代理机构 Jianq Chyun IP Office 代理人 Jianq Chyun IP Office
主权项 1. A writing and verifying circuit for a resistive memory, comprising: a current generator, generating a current according to a bit line voltage, and generating a bias voltage according to the reference current, wherein the bit line voltage continuously increases or decreases from a first voltage level to a second voltage level during a writing and verifying timing period; and at least one current detector, coupled to the reference current generator and a bit line of a selected resistive memory cell of the resistive memory, providing the bit line voltage to the selected resistive memory cell and generating a detected voltage according to a detected current on the bit line, wherein, the at least one current detector determining a finish time point of the writing and verifying timing period by comparing the detect voltage and the bias voltage.
地址 Taichung TW
您可能感兴趣的专利