| 摘要 |
The present invention is to provide an apparatus for measuring a threshold voltage of a thin film transistor (TFT) in a process of manufacturing the TFT of a display device, and a method thereof. To this end, the present invention provides the apparatus for measuring the threshold voltage of the TFT, in which a unit cell includes: the TFT having a gate electrode connected to a gate line and a source electrode connected to a data line; and a capacitor formed between a drain electrode of the TFT and a common signal line, and which comprises: a gate control unit which applies a scan signal to the gate line; a common signal unit which applies a common voltage to the common signal line; and a voltage supply and detection unit which receives charges stored in the capacitor and detects the threshold voltage of the TFT. |
