发明名称 |
METHOD FOR DEPOSITING INSULATION FILM |
摘要 |
According to an embodiment of the present invention, a method for depositing an insulation film comprises: an insulation film deposition step for performing an adsorption step for adsorbing silicon onto a substrate by injecting a silicon precursor into a chamber in which the substrate is loaded, a first purge step for removing an un-reacted silicon precursor and a by-product within the chamber, a reaction step for forming the adsorbed silicon into an insulation film containing silicon by supplying a first reaction source into the chamber, and a second purge step for removing an un-reacted first reaction source and a by-product within the chamber; and a densification step for densifying the insulation film containing the silicon by forming a plasma atmosphere within the chamber, wherein the plasma atmosphere is formed by injecting a second reaction source containing H2 in the densification step in order to improve a step coverage of the insulation film containing the silicon. |
申请公布号 |
WO2016043420(A1) |
申请公布日期 |
2016.03.24 |
申请号 |
WO2015KR07489 |
申请日期 |
2015.07.20 |
申请人 |
EUGENE TECHNOLOGY CO., LTD. |
发明人 |
KIM, HAI-WON;SHIN, CHANG-HUN;KIM, SEOK-YUN;JEONG, CHOON-SIK;SEO, JIN-SEOCK;WOO, SUNG-JOO |
分类号 |
H01L21/31;H01L21/205 |
主分类号 |
H01L21/31 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|