发明名称 METHOD FOR DEPOSITING INSULATION FILM
摘要 According to an embodiment of the present invention, a method for depositing an insulation film comprises: an insulation film deposition step for performing an adsorption step for adsorbing silicon onto a substrate by injecting a silicon precursor into a chamber in which the substrate is loaded, a first purge step for removing an un-reacted silicon precursor and a by-product within the chamber, a reaction step for forming the adsorbed silicon into an insulation film containing silicon by supplying a first reaction source into the chamber, and a second purge step for removing an un-reacted first reaction source and a by-product within the chamber; and a densification step for densifying the insulation film containing the silicon by forming a plasma atmosphere within the chamber, wherein the plasma atmosphere is formed by injecting a second reaction source containing H2 in the densification step in order to improve a step coverage of the insulation film containing the silicon.
申请公布号 WO2016043420(A1) 申请公布日期 2016.03.24
申请号 WO2015KR07489 申请日期 2015.07.20
申请人 EUGENE TECHNOLOGY CO., LTD. 发明人 KIM, HAI-WON;SHIN, CHANG-HUN;KIM, SEOK-YUN;JEONG, CHOON-SIK;SEO, JIN-SEOCK;WOO, SUNG-JOO
分类号 H01L21/31;H01L21/205 主分类号 H01L21/31
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