| 发明名称 |
TRACEABLE INTEGRATED CIRCUITS AND PRODUCTION METHOD THEREOF |
| 摘要 |
An embodiment of a method for producing traceable integrated circuits includes forming on a wafer of semiconductor material functional regions for implementing specific functionalities of corresponding integrated circuits, forming at least one seal ring around each functional region of the corresponding integrated circuit, and forming on each integrated circuit at least one marker indicative of information of the integrated circuit. Forming on each integrated circuit at least one marker may include forming the at least one marker on at least a portion of the respective seal ring that is visible. |
| 申请公布号 |
US2016079181(A1) |
申请公布日期 |
2016.03.17 |
| 申请号 |
US201514948569 |
申请日期 |
2015.11.23 |
| 申请人 |
STMicroelectronics S.r.l. |
发明人 |
Pagani Alberto |
| 分类号 |
H01L23/544;H01L21/268;H01L23/532;H01L21/321;H01L23/58;H01L21/768 |
主分类号 |
H01L23/544 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A method, comprising:
forming on a wafer of semiconductor material including a plurality of die locations a functional region at each die location for implementing specific functionalities of a corresponding integrated circuit; forming a seal ring around the functional region of each integrated circuit, and forming on a top surface of each seal ring at least one marker that provides die information. |
| 地址 |
Agrate Brianza IT |
