发明名称 |
POWER PROFILING METHOD AND POWER PROFILING SYSTEM |
摘要 |
The present invention discloses a power profiling method, a power profiling system, and a processor readable storage medium. The power profiling method includes the following steps: collecting power state information representing software and hardware states for a power domain operated on a target board according to inputted test control information; and generating analysis information for power used on the target board by using the collected power state information. |
申请公布号 |
KR20160029594(A) |
申请公布日期 |
2016.03.15 |
申请号 |
KR20140119368 |
申请日期 |
2014.09.05 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, RAE SEOK;BANG, BYUNG WOO;YU, JUN YOUNG |
分类号 |
G06F1/26 |
主分类号 |
G06F1/26 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|