发明名称 POWER PROFILING METHOD AND POWER PROFILING SYSTEM
摘要 The present invention discloses a power profiling method, a power profiling system, and a processor readable storage medium. The power profiling method includes the following steps: collecting power state information representing software and hardware states for a power domain operated on a target board according to inputted test control information; and generating analysis information for power used on the target board by using the collected power state information.
申请公布号 KR20160029594(A) 申请公布日期 2016.03.15
申请号 KR20140119368 申请日期 2014.09.05
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, RAE SEOK;BANG, BYUNG WOO;YU, JUN YOUNG
分类号 G06F1/26 主分类号 G06F1/26
代理机构 代理人
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