| 发明名称 |
IMPEDANCE CALIBRATION CIRCUIT, AND SEMICONDUCTOR MEMORY AND MEMORY SYSTEM USING THE SAME |
| 摘要 |
An embodiment may include a first replica driver group configured for replicating an output driver of a physical area. A second replica driver group configured for replicating an output driver of a test electrode area for direct access of a memory, and an impedance calibration unit configured to independently perform an impedance matching operation of the first replica driver group and the second replica driver group. |
| 申请公布号 |
US2016071616(A1) |
申请公布日期 |
2016.03.10 |
| 申请号 |
US201414564404 |
申请日期 |
2014.12.09 |
| 申请人 |
SK hynix Inc. |
发明人 |
JEONG Chun Seok |
| 分类号 |
G11C29/12;G11C29/54;G11C29/00;G11C29/02 |
主分类号 |
G11C29/12 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. An impedance calibration circuit comprising:
a first replica driver group configured for replicating an output driver of a physical area; a second replica driver group configured for replicating an output driver of a test electrode area for direct access of a memory; and an impedance calibration unit configured to independently perform an impedance matching operation of the first replica driver group and the second replica driver group. |
| 地址 |
Icheon-si KR |
