发明名称 光学式測定システム
摘要 A system (100) for measurement of spatial coordinates and/or orientation of a probe (101), comprising a first spatial direction sensor (102) associated with a pattern (104) of targets (105) with known positions relative to each other and to the first spatial direction sensor (102), a second spatial direction sensor (103), and processing means (106) for the computation of the orientation and/or spatial coordinates of the pattern (104) of targets (105) relative to the second spatial direction sensor (103) based on the known positions of the targets (105) relative to each other and a determination of the spatial directions of the targets (105) with respect to the second spatial direction sensor (103), wherein at least three of the targets (105) are in the field of view (FOV2) of the second spatial direction sensor (103) irrespective of the orientation of the pattern (104) of targets (105) and wherein the first spatial direction sensor (102) determines the spatial coordinates and/or orientation of the probe (101).
申请公布号 JP5881969(B2) 申请公布日期 2016.03.09
申请号 JP20110092119 申请日期 2011.04.18
申请人 メトロノール アーエス 发明人 オイビンド ロトヴォルド;クヌート アムダル;ハラルド スフェレン
分类号 G01B11/00;G01B11/26 主分类号 G01B11/00
代理机构 代理人
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