发明名称 Radiation image acquisition device
摘要 A radiation image acquisition device includes: a radiation source which emits radiation; a wavelength conversion member of a flat plate shape which generates scintillation light according to incidence of the radiation emitted from the radiation source and transmitted by an object; first imaging means which condenses and images the scintillation light emitted from an entrance surface for the radiation in the wavelength conversion member in a direction of a normal to the entrance surface; and second imaging means which condenses and images the scintillation light emitted from a surface opposite to the entrance surface in the wavelength conversion member in a direction of a normal to the opposite surface.
申请公布号 US9279890(B2) 申请公布日期 2016.03.08
申请号 US201113981469 申请日期 2011.10.21
申请人 HAMAMATSU PHOTONICS K.K. 发明人 Sugiyama Mototsugu;Suyama Toshiyasu
分类号 G01N23/04;G01T1/20 主分类号 G01N23/04
代理机构 Drinker Biddle & Reath LLP 代理人 Drinker Biddle & Reath LLP
主权项 1. A radiation image acquisition device comprising: a radiation source configured to emit radiation; a wavelength conversion member of a flat plate shape configured to generate scintillation light according to incidence of the radiation emitted from the radiation source and transmitted by an object; first imaging means configured to condense and image the scintillation light emitted from an entrance surface for the radiation in the wavelength conversion member in a direction of a normal to the entrance surface; and second imaging means configured to condense and image the scintillation light emitted from a surface opposite to the entrance surface in the wavelength conversion member in a direction of a normal to the opposite surface, wherein each of the first imaging means and the second imaging means has: a condensing lens unit configured to condense the scintillation light emitted from the wavelength conversion member; and an imaging unit configured to image the scintillation light thus condensed, wherein the condensing lens unit of the first imaging means is configured to focus on the entrance surface and condense the scintillation light emitted in the direction of the normal from the entrance surface toward the imaging unit, and wherein the condensing lens unit of the second imaging means is configured to focus on the opposite surface and condense the scintillation light emitted in the direction of the normal from the opposite surface toward the imaging unit.
地址 Hamamatsu-shi, Shizuoka JP