| 摘要 |
The objective of the present invention is to effectively improve a manufacturing line by detecting errors at an early stage. A testing apparatus according to an embodiment comprises a testing part and an imaging part, and a control part. The testing part has light emitting elements arranged in series and irradiates an ultraviolet ray to a substrate which has a light emitting layer in at least one organic EL layer on a main surface from the light emitting element. The imaging part photographs the substrate to which the ultraviolet ray is irradiated, in a predetermined imaging region. The control part detects the error of the substrate based on an image photographed by the imaging part. |
