| 摘要 |
PROBLEM TO BE SOLVED: To provide a sample analyzer capable of detecting light radiated from a sample to the maximum by a detector regardless of the size and position of the sample.SOLUTION: An outgoing light reflection surface drive unit 10 changes the location of an outgoing light condensing reflection unit 32 on the basis of the size of a sample 8 located at a measuring location detected by a size detector 9. Thus, by changing the location of the outgoing light condensing reflection unit 32 according to the height of the sample 8, light emitted from the sample 8 can be sufficiently detected by an optical detector 4 and high precision analysis can be achieved.SELECTED DRAWING: Figure 1 |
