| 摘要 |
Provided are an examination device which is capable of making the temperature of an examination chip in the vertical direction uniform, and an examination program. The examination device is provided with: a holder for holding an examination chip; a centrifuge mechanism which rotates the holder around a main shaft, and rotates the holder around a rocking shaft extending in a direction intersecting the main shaft, to change the direction of the centrifugal force exerted on the holder by the rotation of the main shaft; a heater disposed within a prescribed area including at least the rotational range of the holder rotated by the centrifuge mechanism; and a temperature sensor disposed within the prescribed area. A CPU of the examination device receives (S11) an examination start instruction. The CPU determines (S12) whether the detected temperature is within a steady range including target temperatures. Before receiving the examination start instruction, and determining whether the temperature is within the steady range including the target temperatures, the CPU causes (S5) the heater to generate heat, and causes (S6) the main shaft to rotate at a starting rotational frequency. |
