| 摘要 |
PROBLEM TO BE SOLVED: To provide a coating composition of which a film thickness of a coating film (a thick film of 50 μm or more) can be easily measured based on infrared reflection intensity, and to provide an easy measuring method of a film thickness of a coating film.SOLUTION: A coating composition which enables measurement of a dry film thickness based on infrared reflection intensity is a coating composition with which a dry coating film (A) having a desired dry film thickness of 50 μm or more can be formed on a coated matter (C), and in which (I) infrared transmittance of the dry coating film (A) is 2% or more, and (II) an absolute value of a difference between infrared reflectance Rc% of the coated matter (C), and infrared reflectance Ra% of a laminate constituted of the coated matter (C) and the dry coating film (A) measured from the side on which the dry coating film (A) is laminated, is 2% or more.SELECTED DRAWING: None |
