发明名称 SYSTEMS AND METHODS FOR SUPPORTING GLOBAL EFFECT ANALYSIS
摘要 PROBLEM TO BE SOLVED: To provide improved methods and systems for supporting a global effect analysis of a technical system.SOLUTION: The embodiments include providing a meta-model stored in a computer readable storage medium, where the meta-model comprises at least one assembly of the technical system comprising parts having an associated set of failure mode elements, where each failure mode element has an associated local effect element. The embodiments also include clustering the local effect elements within global effect elements to generate a global effect tree stored in the meta-model.
申请公布号 JP2016012352(A) 申请公布日期 2016.01.21
申请号 JP20150127605 申请日期 2015.06.25
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 KAI HOEFIG
分类号 G06F11/22;G06F11/34 主分类号 G06F11/22
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