| 摘要 |
Provided is an e-fuse test device capable of measuring a programming current of an e-fuse. The e-fuse test device comprises: a first transistor, and a fuse array connected to a source/drain terminal of the first transistor. The fuse array comprises N fuse groups, each of the fuse groups comprises one end, the other end, and M first fuse elements connected in series to each other between the one end and the other end, the one end of each of the fuse groups is connected to each other, and the other end of each of the fuse groups is connected to the source/drain terminal of the first transistor wherein the N and M are natural numbers which are equal to or larger than two. |
