发明名称 HKMG HIGH VOLTAGE CMOS FOR EMBEDDED NON-VOLATILE MEMORY
摘要 The present disclosure relates to a structure and method for embedding a non-volatile memory (NVM) in a HKMG (high-κ metal gate) integrated circuit which includes a high voltage (HV) HKMG transistor. NVM devices (e.g., flash memory) are operated at high voltages for its read and write operations and hence a HV device is necessary for integrated circuits involving non-volatile embedded memory and HKMG logic circuits. Forming a HV HKMG circuit along with the HKMG periphery circuit reduces the need for additional boundaries between the HV transistor and rest of the periphery circuit. This method further helps reduce divot issue and reduce cell size.
申请公布号 US2016005756(A1) 申请公布日期 2016.01.07
申请号 US201414324369 申请日期 2014.07.07
申请人 Taiwan Semiconductor Manufacturing Co., Ltd. 发明人 Chuang Harry-Hak-Lay;Wu Wei Cheng;Kao Ya-Chen;Lu Yi Hsien
分类号 H01L27/115;H01L29/66;H01L29/78 主分类号 H01L27/115
代理机构 代理人
主权项 1. An integrated circuit (IC), comprising: an embedded memory region comprising an embedded non-volatile memory (NVM) device; and a periphery region comprising a high voltage high-κ metal gate (HV HKMG) transistor disposed over a high voltage (HV) gate insulating layer, and a periphery circuit disposed over a gate oxide layer.
地址 Hsin-Chu TW