发明名称 LOW PRESSURISED CONDITIONER OF CHEMICAL MECHANICAL POLISHING APPARATUS
摘要 The present invention relates to a conditioner of a chemical mechanical polishing apparatus, comprising: an arm extending from a center of rotation, and rotating in a reciprocating manner; a conditioning unit rotated by being connected to a driving shift which is rotated in an end portion of the arm, and micro cutting a surface of a polishing pad while pressurizing the polishing pad by holding a conditioning disk on a bottom surface; and a magnetic installed to apply a magnetic force toward a direction for inhibiting that the conditioning unit moves in a gravity direction. By holding the conditioning unit in the opposite direction of gravity by the magnetic force of the magnetic, the conditioner of a chemical mechanical polishing apparatus can reform the polishing pad by pressure which is lower than the weight of the conditioning unit while pressurizing and delicately controlling the polishing pad.
申请公布号 KR20150143991(A) 申请公布日期 2015.12.24
申请号 KR20140072520 申请日期 2014.06.16
申请人 K.C.TECH CO., LTD. 发明人 CHE, HUI SEONG;KIM, JI WOOK
分类号 H01L21/304;H01L21/677 主分类号 H01L21/304
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