发明名称 |
SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device having a configuration capable of suppressing a decrease in electrical characteristics which becomes remarkable in association with miniaturization.SOLUTION: A semiconductor device comprises: a first oxide film; an oxide semiconductor film on the first oxide film; a source electrode and a drain electrode in contact with the oxide semiconductor film; a second oxide film on the oxide semiconductor film, the source electrode, and the drain electrode; a gate insulating film on the second oxide film; and a gate electrode in contact with the gate insulating film. An upper end in a channel width direction of the oxide semiconductor film includes a curved surface. |
申请公布号 |
JP2015216282(A) |
申请公布日期 |
2015.12.03 |
申请号 |
JP20140099168 |
申请日期 |
2014.05.13 |
申请人 |
SEMICONDUCTOR ENERGY LAB CO LTD |
发明人 |
HANAOKA KAZUYA;MATSUBAYASHI DAISUKE;KOBAYASHI YOSHIYUKI;YAMAZAKI SHUNPEI;MATSUDA SHIMPEI |
分类号 |
H01L29/786;H01L21/28;H01L21/336;H01L21/8234;H01L21/8238;H01L21/8242;H01L21/8247;H01L27/088;H01L27/092;H01L27/105;H01L27/108;H01L27/115;H01L29/417;H01L29/423;H01L29/49;H01L29/788;H01L29/792 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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