发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device having a configuration capable of suppressing a decrease in electrical characteristics which becomes remarkable in association with miniaturization.SOLUTION: A semiconductor device comprises: a first oxide film; an oxide semiconductor film on the first oxide film; a source electrode and a drain electrode in contact with the oxide semiconductor film; a second oxide film on the oxide semiconductor film, the source electrode, and the drain electrode; a gate insulating film on the second oxide film; and a gate electrode in contact with the gate insulating film. An upper end in a channel width direction of the oxide semiconductor film includes a curved surface.
申请公布号 JP2015216282(A) 申请公布日期 2015.12.03
申请号 JP20140099168 申请日期 2014.05.13
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 HANAOKA KAZUYA;MATSUBAYASHI DAISUKE;KOBAYASHI YOSHIYUKI;YAMAZAKI SHUNPEI;MATSUDA SHIMPEI
分类号 H01L29/786;H01L21/28;H01L21/336;H01L21/8234;H01L21/8238;H01L21/8242;H01L21/8247;H01L27/088;H01L27/092;H01L27/105;H01L27/108;H01L27/115;H01L29/417;H01L29/423;H01L29/49;H01L29/788;H01L29/792 主分类号 H01L29/786
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