PROGRAMMABLE STITCH CHAINING OF DIE-LEVEL INTERCONNECTS FOR RELIABILITY TESTING

摘要

A method includes fabricating a set of die in a production run, each die comprising a set of pads at a periphery of a top metal layer, a first set of fuse elements, and a second set of fuse elements. Each fuse element of the first set of fuse elements couples a corresponding pad of the set to a corresponding bus when in a conductive state, and each fuse element of the second set couples a corresponding subset of pads of the set together when in a conductive state. The method further includes selecting a subset of the die of the production run for testing, and configuring each die of the subset for testing by placing each fuse element of the first set in a non-conductive state and placing each fuse element of the second set in a conductive state.

主权项

1. An integrated circuit (IC) die comprising:
a set of pads at a periphery of a top metal layer; a first set of fuse elements, each fuse element of the first set of fuse elements coupling a corresponding pad of the set to a corresponding bus when in a conductive state; and a second set of fuse elements, each fuse element coupling a corresponding subset of pads of the set together when in a conductive state.