发明名称 両面研磨装置用キャリア及びウェーハの両面研磨方法
摘要 A method provides a carrier used in a double-side polishing apparatus such that the carrier is disposed between upper and lower turn tables to which polishing pads are attached in the double-side polishing apparatus and holds a wafer interposed between the upper and lower turn tables in a holding hole formed in the carrier during polishing, including upper and lower main surface portions composed of a &bgr;-titanium alloy obtained from pure titanium containing 0.5 weight % or more of a &bgr;-stabilizing element. The carrier has a high abrasion resistance and can reduce its cost.
申请公布号 JP5807648(B2) 申请公布日期 2015.11.10
申请号 JP20130014172 申请日期 2013.01.29
申请人 信越半導体株式会社 发明人 佐々木 正直;内山 勇雄
分类号 B24B37/28 主分类号 B24B37/28
代理机构 代理人
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