发明名称 SLICER TRIM METHODOLOGY AND DEVICE
摘要 Described embodiments provide for, in a receiver circuit employing a data latch, circuitry to adjust trim offset of the data latch to account for latch functional features (e.g., hysteresis and metastability) that may interact with trim of the latch. In accordance with the described embodiments, a trim procedure runs in a pre-selected directions of offset voltage ramp in order to average out the effect of hysteresis and metastability on the final trim offset choice. Different thresholds for accumulated slicer “0” and “1” discrimination of the circuitry to adjust trim offset allows for significant reduction in the number of trim runs, accelerating the slicers' trim process allowing for relatively quick determination of trim offset whenever the slicers are idle.
申请公布号 US2015319018(A1) 申请公布日期 2015.11.05
申请号 US201414288838 申请日期 2014.05.28
申请人 LSI Corporation 发明人 Sindalovsky Vladimir;Smith Lane A.;Fitzgerald Niall
分类号 H04L25/03;H04L27/01 主分类号 H04L25/03
代理机构 代理人
主权项 1. A method of generating a trim offset in a decision device, the method comprising: applying a signal including a sequence of equivalent data values to the decision device; initializing the trim offset value to a first trim value, the trim offset value applied to the decision device to set a decision threshold for the decision device; varying the trim offset value over a range of trim values defined by a first trim value and a second trim value; generating an inconclusive region by, for each of the trim values: accumulating at least one output value of the decision device,comparing the accumulated output value of the decision device to a high threshold and a low threshold, andclassifying, as conclusive or inconclusive, a current value of the trim offset value corresponding to each data value based on the comparison; and determining a desired trim offset value as the trim value about a center of the inconclusive region.
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