| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide an oscillator inspection method and an oscillator inspection apparatus capable of discriminating an oscillator oscillating spuriously. <P>SOLUTION: Main oscillation and spurious impedance are obtained by measuring the impedance for the frequency of an oscillator to be inspected (first step). Based on the main oscillation and spurious impedance obtained in the first step, main oscillation and the spurious reactance and resistance are obtained (second step). The resistance for the reactance of main oscillation obtained in the second step is compared with the resistance for the spurious reactance. When there is spuriousness indicating a resistance smaller than the resistance of main oscillation, in the reactance corresponding to the load capacity range of an oscillation circuit with which the oscillator to be inspected may be connected, a determination is made that the oscillator oscillates spuriously (third step). <P>COPYRIGHT: (C)2013,JPO&INPIT</p> |
