发明名称 Fin isolation in multi-gate field effect transistors
摘要 A method for fabricating a field effect transistor (FET) device includes forming a plurality of semiconductor fins on a substrate, removing a semiconductor fin of the plurality of semiconductor fins from a portion of the substrate, forming an isolation fin that includes a dielectric material on the substrate on the portion of the substrate, and forming a gate stack over the plurality of semiconductor fins and the isolation fin.
申请公布号 US9178019(B2) 申请公布日期 2015.11.03
申请号 US201514613781 申请日期 2015.02.04
申请人 GLOBALFOUNDRIES INC. 发明人 Cheng Kangguo;Haran Balasubramanian S.;Khakifirooz Ali;Ponoth Shom;Standaert Theodorus E.;Yamashita Tenko
分类号 H01L29/76;H01L29/06;H01L29/66;H01L21/8234;H01L21/84;H01L27/088;H01L27/12;H01L29/78 主分类号 H01L29/76
代理机构 Cantor Colburn LLP 代理人 Cantor Colburn LLP
主权项 1. A field effect transistor (FET) device, comprising: a first plurality of semiconductor fins on a substrate; a second plurality of fins on the substrate; an isolation fin that includes a dielectric material on the substrate, the isolation fin disposed between the first plurality of semiconductor fins and the second plurality of semiconductor fins; distal ends disposed at individual pairs of the first and second plurality of semiconductor fins, the distal ends comprising the dielectric material of the isolation fin so as to physically connect the individual pairs of semiconductor fins, while maintaining electrical isolation of the individual pairs of semiconductor fins; and a gate stack over the first and second plurality of semiconductor fins and the isolation fin.
地址 Grand Cayman KY