| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide an IC test method capable of suppressing continuous determination of a non-defective article to be a defective article due to deterioration of partial sockets out of a plurality of sockets.SOLUTION: In an IC test method repeating steps of setting an IC to each of a plurality of sockets 15 through 18 of an IC handler 20, simultaneously measuring the IC by a tester 11 and performing quality determination, a yield of the IC is calculated for each of the plurality of sockets 15 through 18 from a quality determination result of the IC measured for each of the plurality of sockets 15 through 18, a best yield out of the yield for each of the sockets 15 through 18 is compared with the other yields and the sockets having yields lower than the best yield by a value equal to a constant value or more are not used from subsequent measurement when there are the yields lower than the best yield by the value equal to the constant value or more.</p> |
