发明名称 Probe tip
摘要 <p>To eliminate or otherwise reduce unintended movement of a probe tip of a probe assembly being held by a probe arm, the probe assembly includes one or more resilient members that compensate for the contraction or expansion of the probe arm in accordance with the coefficient of thermal expansion of the material from which the probe arm is made. Thus, the probe tip can remain in contact with a sample being measured at the desired location on the sample, during an automated full or wide scale temperature range sweep.</p>
申请公布号 EP2159580(B1) 申请公布日期 2015.10.07
申请号 EP20090252043 申请日期 2009.08.24
申请人 LAKE SHORE CRYOTRONICS, INC.;TOYO CORPORATION 发明人 CAUDILL, JASON C.;MALOOF, EDWARD;YAMAGUCHI, MASAKI;MIZUTA, SHIN
分类号 G01R1/067;G01R1/073;G01R31/28 主分类号 G01R1/067
代理机构 代理人
主权项
地址