发明名称 MOSFET with isolation structure for monolithic integration and fabrication method thereof
摘要 A MOSFET device with an isolation structure for a monolithic integration is provided. A P-type MOSFET includes a first N-well disposed in a P-type substrate, a first P-type region disposed in the first N-well, a P+ drain region disposed in the first P-type region, a first source electrode formed with a P+ source region and an N+ contact region. The first N-well surrounds the P+ source region and the N+ contact region. An N-type MOSFET includes a second N-well disposed in a P-type substrate, a second P-type region disposed in the second N-well, an N+drain region disposed in the second N-well, a second source electrode formed with an N+ source region and a P+ contact region. The second P-type region surrounds the N+ source region and the P+ contact region. A plurality of separated P-type regions is disposed in the P-type substrate to provide isolation for transistors.
申请公布号 US7847365(B2) 申请公布日期 2010.12.07
申请号 US20050913037 申请日期 2005.10.14
申请人 SYSTEM GENERAL CORP. 发明人 HUANG CHIH-FENG;CHIEN TUO-HSIN;LIN JENN-YU;YANG TA-YUNG
分类号 H01L29/78 主分类号 H01L29/78
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